功率半導體的完整測試解決方案
Total Testing Solution for Power Semiconductor
Static Characterization
ID-VD curve, ID-VG Curve, RDS(on), V(BR)DSS, IGSS, IDSS, VGS(th), etc.
ID-VD curve, ID-VG Curve, RDS(on), V(BR)DSS, IGSS, IDSS, VGS(th), etc.
Dynamic Characterization
HV Ciss, Coss, Crss, Eoss, QG, Ton/Toff Loss, dV/dt, dI/dt, On delay, Off delay, Qrr, trr, Irr, etc.
HV Ciss, Coss, Crss, Eoss, QG, Ton/Toff Loss, dV/dt, dI/dt, On delay, Off delay, Qrr, trr, Irr, etc.
Thermal Characterization
Transient thermal Impedance, SOA, RthJC, RthJA(Note: Follow JEDEC 15-14 compliance)
Transient thermal Impedance, SOA, RthJC, RthJA(Note: Follow JEDEC 15-14 compliance)