今日熱門主題 :「專業引領，創新前沿」

- 新世代進階曲線追蹤儀

(Curve Tracer Professional)

Today's Hot Topic: 

"Professional Leadership, Innovation Frontier"

Next-Generation Advanced Curve Tracer 

(Curve Tracer Professional)

隨著半導體行業的快速發展，工程與品質團隊面臨著日益嚴峻的挑戰，特別是在確保產品符合最高品質標準方面。為了滿足這些需求，專業的測量工具成為提升產品可靠性和效能的關鍵。以下總結展示了一款測量儀器的五大核心亮點，這些特點專為提升測量精確度和效率而設計，不只滿足半導體產業對於品質的專業需求，更可以在半導體產業的高度競爭中成就業界翹楚。

As the semiconductor industry rapidly evolves, engineering and quality teams face increasingly severe challenges, especially in ensuring products meet the highest quality standards. To address these needs, professional measuring tools have become key to enhancing product reliability and performance. Here we summarize five core highlights of a measuring instrument, designed specifically to enhance measurement accuracy and efficiency, not only meeting the semiconductor industry's professional needs for quality but also excelling in the highly competitive field.

五大核心亮點，突顯專業優勢：

Five Core Highlights, Emphasizing Professional Advantages:

1. 全範圍量測：這款儀器能夠進行從微安(pA)至高功率(200V/10A)的全範圍量測，確保能捕捉到每一個至關重要的IV Curve。無論是在極低的信號還是在高功率應用中，都能提供精確可靠的測量結果，滿足各種嚴格的測試需求。​
   Full Range Measurement: This instrument can measure from picoamperes (pA) to high power (200V/10A), ensuring every critical IV Curve is captured. Whether at very low signals or high power applications, it provides accurate and reliable measurement results, meeting various stringent testing requirements.

2. 進階曲線分析：裝備了先進的統計分析功能，如相關系數(R2)和殘差平方和(SSE)，使工程師能夠輕鬆進行數據解析和比較與Golden Sample的差異。此外，還可對比多組待測物（DUT）之間的性能差異，有助於確保產品間的一致性和可靠性。
   ​Advanced Curve Analysis: Equipped with advanced statistical analysis features such as correlation coefficient (R2) and sum of squares due to error (SSE), enabling engineers to easily analyze data and compare differences with the Golden Sample. Additionally, it can compare performance differences between multiple devices under test (DUT), helping ensure product consistency and reliability.

3. 真實追蹤呈現：透過即時(Real Time)的IV曲線和Excel數據輸出功能，每次的測量IV Curve與Data都能被完整理記錄下來，進一步增強數據的可追溯性和透明度，對於進行深入分析和報告撰寫來說至關重要。
   True Tracing Display: With real-time IV curve and Excel data output capabilities, each measurement IV Curve and Data are thoroughly recorded, further enhancing data traceability and transparency, which is crucial for in-depth analysis and report writing.

4. 進階量測功能：搭載Curve Master功能，如同半導體參數分析儀(e.g., Keysight B1500, Keithley 4200A)的功能與準度，允許使用者自定義進階的量測參數(e.g., NPLC, Delay)，提供更大的靈活性和適應性以應對特定的測試要求。這項功能讓儀器不僅限於標準的應用，也能滿足更專業的定制需求。
   Advanced Measurement Features: Featuring the Curve Master function, similar to semiconductor parameter analyzers (e.g., Keysight B1500, Keithley 4200A) in functionality and accuracy, it allows users to define advanced measurement parameters (e.g., NPLC, Delay), offering greater flexibility and adaptability to meet specific testing requirements. This feature makes the instrument not only suitable for standard applications but also meets more professional customization needs.

5. 升級潛力強大：本儀器支持升級如Pulse IV和Transient IV等進階量測功能，並能與其他儀器協作，提供一個全面而整合的測試解決方案。這種升級潛力使其不僅適用於當前的需求，同時也能應對未來技術的發展和變化。
   ​Strong Upgrade Potential: The instrument supports upgrades such as Pulse IV and Transient IV measurement functions and can collaborate with other instruments, providing a comprehensive and integrated testing solution. This upgrade potential makes it suitable not only for current needs but also for future technological developments and changes.

為什麼使用本新世代進階曲線追蹤儀 (Curve Tracer Professional)?

Why Use This Next-Generation Advanced Curve Tracer (Curve Tracer Professional)?

1. Semiconductor: 針對半導體產業(e.g., Package IC) 產品電性與IV Curve分析所需而設計的；更重要的是國內外記憶體與封測大廠已全面導入使用中.
   Semiconductor: Specifically designed for the semiconductor industry (e.g., Package IC) for electrical property and IV Curve analysis; importantly, major domestic and international memory and packaging manufacturers have fully integrated its use.

2. Resolution: 量測電流解析度為TEK Curve的一百萬倍 (i.e., fA vs. nA)
   Resolution: Measurement current resolution is a million times that of TEK Curve (i.e., fA vs. nA).

3. Output Waveform: AC SINE, Pulse, 還可以作Single/Dual DC Sweep.
   Output Waveform: AC SINE, Pulse, can also perform Single/Dual DC Sweep.

4. Image & Data: 可即時儲存量測的IV圖形以及量測資料
   Image & Data: Can instantly save measured IV graphics and data.

5. Analysis: 具有疊圖分析的功能, 並且自動計算統計指標(i.e., R2, SSE)
   Analysis: Features overlay analysis function, and automatically calculates statistical indicators (i.e., R2, SSE).

6. Recipe Manager: 可高效管理數百數千的產品與測試條件
   Recipe Manager: Efficiently manages hundreds to thousands of products and test conditions.　

7. Curve Master: 如同半導體參數分析儀 (e.g., Keysight B1500, Keithley 4200A)的功能與準度，允許使用者自定義進階的量測參數(e.g., NPLC, Delay)，提供更大的靈活性和適應性以應對特定的測試要求。
   ​Curve Master: Similar to semiconductor parameter analyzers (e.g., Keysight B1500, Keithley 4200A) in functionality and accuracy, allowing users to define advanced measurement parameters (e.g., NPLC, Delay), offering greater flexibility and adaptability to meet specific testing requirements.

操作介面